Heavy ion Single Event Effects (SEE) results for PWM5032 Pulse Width Modulator Controller

H eavy Ion (HI) testing of the PWM5032 PWM Controller was performed at Texas A&M University (TAMU). Testing resulted in no destructive failures (either SEL or SEGR). Non-destructive events, such as transients and frequency variations were observed and characterized with candidate Weibull fitting parameters as determined herein.