Analysis of FPGA Mitigation Improvement to Energetic Protons

we present a model for analyzing the mitigation improvement of single event upset (SEU) for triple modular redundant (TMR)-Field Programmable Gate Arrays (FPGAs) to energetic protons. Based on the cross section versus proton energy curve by Weibull fit, system failure rates of Non-TMR and TMR designs for Xilinx Virtex-4 FPGA were calculated as an example to explain this model. Energetic proton test data was shown to fit the model. Analysis result showed that TMR and scrubbing mitigation could decrease the system failure rate to 18.5 times compared with Non-TMR, and the test result was 14.8 times. The deviation between the analysis and test was about 20%.