Millimeter-Wave and THz Polarimetric Imaging

In this paper, we present our recent work on polarimetric imaging in millimeter wave (mmW) and terahertz (THz) bands. Polarimetric techniques have been widely used at optical frequencies to help analyze the fine details of a material or to help resolve the orientation of small structures in the sensing samples. There has been relatively little research published in mmW and THz bands. Our goal is to fill the gaps in Mueller imaging in these frequency bands. The construction of Mueller matrix only requires intensity measurements and therefore, the data acquisition time is faster and equipment cost is cheaper than other imaging techniques that require phase information. The system hardware and measured results for both mmW and THz bands are presented.