Design and Implementation of Power Efficient Logic BIST With High Fault Coverage Using Verilog

Due to ever increasing number of transistors on chip and decrease in feature size have posed challenges in manufacturing and have risen defects due to them. Thus, testing have become vital for any Very Large Scale Integrated (VLSI) design. The design engineers concentrate more on design development and test techniques used to test those designs are neglected due to design cycle time. Any design will not be passed unless it is 100% fault free and Design For Testability (DFT) technique facilitates to detect the faults. Multiple standards are developed to test different part of Integrated circuits. In this paper power efficient & high fault coverage Built In Self-Test (BIST) is designed and implemented to test combinational logic. The developed technique is tested on standard combinational circuits and has given promising results. The conventional Linear Feedback Shift Register (LFSR) is modified to generate all the states, hence improving fault coverage. Compared to conventional method, 100% fault coverage & 12.25% reduction in power is achieved by the proposed design. The design is coded in Verilog, verified for functionality using Xilinx ISIM simulator, synthesized by targeting the design to slow_vdd1v0 1.0 library for 45nm technology using Cadence genus tool and validated on FPGA Spartan 6 boards.