Co-design Circuit Simulation to Investigate the Failure of Devices under Surge Stress

System efficient ESD design (SEED) is an effective method for simulating Electrostatic discharge (ESD) behaviors of a system. Based on this simulation method, this work investigates transient behaviors of a co-design protection circuit and failure of a hybrid-triggered power clamp under surge stress. In addition to utilization of transmission line pulsing (TLP) I-V curves, transient TLP waveforms are also used for building the component and device models in the co-design protection circuit. Moreover, the relevant measurements are included in this work for verifying the simulation results of the co-design protection circuit and failure analysis of the power clamp.