Ionizing Radiation Effects Spectroscopy for Analysis of Single-Event Transients

Ionizing radiation effects spectroscopy (IRES) for characterization of single-event transients (SETs) in space-deployed electronics is demonstrated. IRES enhances time-frequency spectroscopy techniques with statistical analysis, allowing for the capture of subtle changes in circuit dynamics. This is illustrated through the use of experimental data captured from two-photon absorption laser experiments on a phase-locked loop (PLL) designed and fabricated in a 130 nm CMOS technology, and further explained through the use of behavioral modeling of the PLL. The technique leverages the computational benefits of discrete windowed analysis, requiring as little as 0.2% of the data samples required in high-resolution discrete Fourier transform analysis while providing a statistical method for accurately estimating the SET characteristics.