Transmission/Reflection System For Dielectric Characterization Using Coaxial Probes

This paper shows a project that develop a complete system of dielectric property measurements. This system ought to be simple, intuitive, fast, cheap and complete. Moreover, it must show a disruptive value compared to the conventional systems. The system basically consists of two different elements. Firstly, a low-cost vector network analyzer. Secondly, two optimized coaxial probes. Measuring the scattering parameters with a thin sample located between the probes, the dielectric properties of the sample can be calculated. This system has been designed and manufactured, with very promising results. Furthermore, it offers a future line of research. This prototype may become a marketable product.