Compressed Sensing Image Reconstruction For Millimeter-Wave Near-Field Scanning Microscopy Using a Metal Slit Probe

We report on the use of a compressed sensing technique for two-dimensional image reconstruction in millimeter-wave near-field scanning microscopy that enables the measurement time required to acquire the projection data sets to be reduced. Experiments performed at 60 GHz to image the electrical response anisotropy of the sample using compressed sensing image reconstruction show that just 1/8th of the full scan data needs to be measured to allow perfect image reconstruction.