Characterization of a Terahertz Isolator using a 1.5 Port Vector Spectrometer

The 1.5 port vector spectrometer combines both transmission and reflection geometry of terahertz time domain spectroscopy (THz TDS) in a single setup which is beneficial for various characterization applications. Such an application is demonstrated here where we characterized a non-time invariant device - a terahertz isolator, in terms of isolation level and insertion loss using the 1.5 port vector spectrometer.