Near-field Spectrum Analysis of TDS s-SNOM

TDS s-SNOM, combining two powerful scientific research tools: Scattering type scanning Near-field optical microscope (s-SNOM) and Terahertz Time Domain Spectroscopy (THz-TDS), has brought out promising capacity at nanoscale. In this work, by analyzing four physical mechanisms in tip-cantilever-substrate model of TDS s-SNOM and simulating related parameters, we report on how tip-cantilever-substrate model affect near-field spectrum and local field density. Numerical simulation results are in good agreement with current experimental result. Further experiments are still in progress. This is of great significance to the development of TDS s-SNOM.