Single-Shot Carrier-Envelope Phase (CEP) Measurements and the Focal Phase Effect in Strong-Field Ionization

The carrier-envelope phasemeter (CEPM), based on the stereographic detection of above-threshold ionization (ATI) spectra, can measure the carrier-envelope phase (CEP) for each and every single laser shot with high precision [1]. An additional and very valuable feature of the CEPM is that the duration of few-cycle pulses can be characterized simultaneously to the CEP measurements by utilizing the radius of the so-called parametric asymmetry plots (PAPs) that can be derived from the ATI spectra. Recently, this technique has further been developed and now can operate at 1800 nm [2] and at 800 nm with 100 kHz repetition rate [3].