Different Test Site Analysis of Radiated Field Measurements of a Complex EUT

The goal of the COST IC1407 Action is to investigate the radiated emission characteristics in densely integrated technologies. One of the promising techniques for this application is the Near Field Scanning (NFS), as it allows to measure the near field intensity with a very high resolution, which is especially useful for tracking down critical components, even on a board level. The results can additionally be translated to the far field equivalents, comparable with the conventional emissions measurement standards. In this study, we investigate this technique with respect to another, commonly recognized emission measurement techniques, such as semi-anechoic chamber (SAC), fully anechoic room (FAR), gigahertz transverse-electromagnetic (GTEM) cell, and reverberation chamber (RC). As opposed to classical round-robin tests, where a simple reference radiator is measured, in order to increase the harshness of our tests, we used as a test sample with very complex, unpredictable and unstable behavior, an Intel Galileo board- a perfect example of real equipment.