Facile Identification of Graphene's Crystal Orientations by Optical Microscopy of Self-Aligned Microwires

This work presents a facile identification method for the crystal orientations of graphene using the directional alignment between AgCN microwires and the underlying graphene. Because the microwires in the present work are visible with conventional optical microscopy, large-area graphene can be inspected with simple procedures. In the experimental study, we confirmed that the microwires can indicate graphene's crystal orientations with an acceptable accuracy as well as can be removed with a simple wet-etching process.