A Test Cases Generation Technique Based on an Adversarial Samples Generation Algorithm for Image Classification Deep Neural Networks

With widely applied in various fields, deep learning (DL) is becoming the key driving force in industry. Although it has achieved great success in artificial intelligence tasks, similar to traditional software, it has defects that, once it failed, unpredictable accidents and losses would be caused. In this paper, we propose a test cases generation technique based on an adversarial samples generation algorithm for image classification deep neural networks (DNNs), which can generate a large number of good test cases for the testing of DNNs, especially in case that test cases are insufficient. We briefly introduce our method, and implement the framework. We conduct experiments on some classic DNN models and datasets. We further evaluate the test set by using a coverage metric based on states of the DNN.