Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement

In this paper, simple and compact Negative Bias Temperature Instability (NBTI) model is proposed. The model is based on the reaction-diffusion (t
ⁿ
) and hole-trapping (log(t)) theories. A single shot of DC stress and recovery data is utilized to express duty cycle dependence of NBTI degradation and recovery. Parameter fitting is proceeded by considering that the amount of recovery cannot be larger than stress degradation. The proposed model successfully replicates stress and recovery with various duty cycles.