Quantitative Characterization of Defects With Fixed-Delay THz Sensors

The extraction of information from defects in samples made of nonpolar nondispersive dielectrics (such as plastic, ceramic, glass, and composites) using a fast fixed-delay configuration in a THz photoconductive platform is investigated. Experimental results show that information such as changes in the sample profile and void volume can be extracted in a range of defect sizes. This approach can ease THz quality control in certain industries.