Development of a New Material Analyzing Software Using X-Ray Diffraction

X-ray diffraction is an effective mean for analyzing material properties. This paper introduces new computational software for experimentally determining the properties of crystalline materials such as elastic constants, residual stresses, surface hardness, multi-phase quantitative analyzing, thickness of coating layer, grain size, and etc. The software inputs the X-ray experimental data, then computes the properties and exports the results. The results computed from the X-ray diffraction method were compared to those from the traditional methods and they are in the 95% confidential limits, showing that the newly developed software gives rapid computational process with very high reproducibility, allowing applicability in laboratories and a possibility of its commercialization.