Characterization of interconnect coupling noise using in-situ delay-change curve measurements

The delay-change curve (DCC) characterizes the variation of the interconnect delay due to coupling noise. This paper describes a set of novel models that relate the DCC to the coupling noise waveform. These models are targeted for use in the timing margin design and accurate experimental determination of sub-nanosecond coupling noise. The circuit structure, a set of measurements, the model equations, and the waveform extraction procedures are newly proposed. Evaluation results using a 0.25 /spl mu/m test chip are presented showing good agreement with SPICE simulations.