Time-Dependent Single-Event Effects in CMOS $LC$ -Oscillators

This paper presents a general theory of time-dependent single-event effects in CMOS LC-oscillators. The analysis employs the oscillator's impulse-sensitive function (ISF) to calculate the effect of a transient current due to an ionizing particle. A discussion is made on the dependence of the maximum junction collection current and the modulation of this current with the voltage-controlled oscillator (VCO) signal waveform, supported by TCAD simulations. An experimental study using a two-photon absorption (TPA) laser setup is performed to obtain accurate measurements of the time-dependent charge-to-phase transfer function of the oscillator.