Simulation Modeling Channel Noises of IR-Sensor

We suggest a relatively simple method of simulation modeling channel noises for different infrared (IR) sensors to avoid their physical or mathematical modeling. Now, instead of solving complex equations, there are used three random number generators to simulate fixed pattern noise (FPN) of sensitivity, dark current and additive correlated noise for each channel of the IR-sensors with different variants of photosensitive elements placement. The method can be useful for developing different algorithms of IR image processing.