Innovative Practices on In-System Test and Reliability of Memories

This innovative practice session includes three presentations which discuss test and reliability issues and solutions for external and embedded memories. At speed test for external memories, memory array diagnosis and interconnect faults detection, as well as the peculiarities of supporting different memory IPs including DRAM and HBM2 are among the topics discussed. As for embedded memories, FIT rate calculation and mitigation methodology is presented which is shown to be critical for automotive SoCs.