A Total Ionizing Dose Detecting Circuit Based on Off-state Leakage Current of NLDMOS in Power IC

Due to the demand of aerospace applications, radiation-hard techniques have become critical for power IC. In order to compensate the total ionizing dose (TID) effect on the circuits, detecting it is the precondition. The TID detecting circuit proposed in this paper is able to monitor the TID effect on power IC accurately in the radiated environment. Moreover, it can be integrated with conventional power IC in an ordinary commercial process. Namely, the signals generated by the detecting circuit can be applied to TID compensation for power IC flexibly. The simulation results of the detecting circuit can meet the design requirements accurately from radiation experiment.