Analysis of a test setup for the characterization of integrated circuits electromagnetic emissions

This paper deals with the characterization of integrated circuits (ICs) electromagnetic emission. In particular, a critical assessment of IEC 61967-4 measurement procedure is presented. The correlation between the measurements and the emission properties of ICs is investigated. Signal degradation effects introduced by the test setup have been experimentally evaluated by exploiting an ad hoc calibration test board. Beyond a quantitative characterization of the limits of the above-mentioned measurement technique, the results shown in this paper allow the identification a new and effective way to describe electromagnetic emission of output drivers.