Test Environments for 5G Millimeter-Wave Devices

As 5G systems are developed and deployed, the RF devices comprising these networks require various types of tests at multiple stages of the design and manufacturing processes. The use of millimeter-wave frequencies and massive MIMO, a combination of technologies intended to ensure sufficient bandwidth and SNR to support massive data throughput, is leading to unprecedented levels of integration of antenna arrays and transceivers. Testing these highly integrated devices is becoming increasingly complex and challenging. In this paper, we investigate various test environments for 5G over-the-air (OTA) testing including far-field, compact range, and near-field chambers. We examine the advantages and disadvantages of each for measuring various over-the-air (OTA) test metrics. This paper offers a high-level trade study by broadly analyzing cost, path loss, and applicability of each environment to different types of OTA tests.