Simulation of Transistor-Level Radiation Effects on System-Level Performance Parameters

A simulation paradigm is proposed to examine the effects of transistor-level degradation produced by total ionizing dose (TID) on top-level system performance parameters. The approach is demonstrated on a command and data handling (C&DH) board for deep-space CubeSats. Simulation and postirradiation measurements of a temperature control loop show that TID degradation changes temperature regulation significantly.