Analysis of Asymmetric Broad-Side Coupled Lines by Conformal Mapping Technique

For the first time, analysis of asymmetric broad-side coupled lines in a layered dielectric medium taking into account the thickness of the strips carried out by the conformal mapping technique is presented. On the basis of the proposed mathematical model, a computer program was developed using the SC-toolbox package, which implements direct and inverse Schwartz-Christoffel transformations in the MATLAB environment. It is revealed that taking into account the dielectric filling is the greatest difficulty. Initial testing of the program showed its high computational efficiency.