Characterization of H-field Probes regarding Unwanted Field Suppression using Different Calibration Structures

In contrast to far-field measurements in a few meter distance, near-field measurements directly above a device allow a deeper and more detailed view on the electromagnetic behavior of a circuit. To obtain the correct field strength values from the measurement, it is essential that the probes are well characterized. An intrinsic property of an H-field probe is the capability to also capture E-fields. Hence, this paper presents a first approach to examine the so-called unwanted field suppression of near-field probes using the example of a tangential H-field probe of the NFS3000.