Advanced Circuit Reliability Verification for Robust Design

The growth in safety-critical applications for automotive electronics and mainstream adoption of FinFET technologies have resulted in significant increase in IC design reliability challenges. IC designers must contend with advanced circuit complexity with stringent requirements on performance, low power, design robustness for safety, and reliability such as electro-migration and device-aging. For safety-critical applications such as Autonomous Driving, ADAS, and Connected Car, IC designers are now looking to adopt rigorous and systematic methodologies to meet functional safety standard. In this paper, we will discuss the models used on circuit reliability verification, and application of these models to assess IC reliability for targeted requirements with latest Synopsys' AMS solution for robust design.