Enhanced - resolution material imaging with dielectric resonators: a new implicit space - domain technique

A new method of resolution improvement for dielectric resonator material measurements is proposed. Initially, a material sample is scanned with the resonator over a 2D mesh of scanning points, and thereby at each point a weighted average of complex permittivity over the region interacting with the resonator fields is produced. Then a space-domain implicit (SDI) problem is formulated that relates the explicit measurements to the enhanced permittivity pattern through the pre-simulated electric field pattern of the resonator. A robust SVD-based technique for solving the implicit problem is developed. The SDI method is validated on virtual samples and successfully applied to the available laboratory scan.