Extraction of Electrical- and Noise-Parameters of Fully-Differential-Amplifier Subcircuits

This paper presents an approach for investigating the operation of fully differential circuits that have internal nodes that are not available for direct measurement. This approach is based on a new method of extracting the electrical and noise parameters of the differential-circuit subcomponents. Two single-ended noise-parameter measurements and one measurement of S-parameters are required for the presented method. Simulations and measurements were used to confirm the viability of the method.