A Stressed Eye Testing Module for Production Test of 30-Gbps NRZ Signal Interfaces

In high-speed data transmissions with small-amplitude signals, since jitter and noise in the transmitted signal may cause bit errors at receiver side, stressed eye testing which tests receivers with a degraded signal becomes very important. This paper introduces a stressed eye testing module for 30-Gbps nonreturn to zero (NRZ) signals. It can inject random jitter (RJ), sinusoidal jitter (SJ) and sinusoidal interference (SI) into the input signal for a receiver under test. A calibration method of RJ, SJ and SI values for the specified stressed bathtub curve is also proposed. This module can provide existing automatic test equipment with the stressed eye testing functions which can be applied to production testing.