The Suitability of the SPR-MP Method to Evaluate the Reliability of Logic Circuits

Methods to estimate circuit reliability are important, especially when nanometer scale technologies are involved. In the present work, two methods, PTM and SPR, are applied to evaluate 9 combinational circuits. The study focuses on determining the limits of PTM and SPR in terms of number of operations, processing time and accuracy. The work explores too the SPR Multi-pass approach, to evaluate the influence of reconvergent signals in circuit's reliability.