Efficient and Quantitative Characterization of Carbon Nanotube Thin Films

Quantitative characterization of the Carbon nanotube (CNT) thin film quality is essential for the development of carbon nanotube thin film transistors (CNT-TFTs). In this paper, we report a density characterization method for CNT thin films based on image processing of scanning electron microscope (SEM) images of CNT thin films. The density and uniformity of large area CNT films can be evaluated quantitatively, accurately and high efficiently by this method.