Design of A Silicon Waveguide Admittance Detecting Circuit Using Quadratic Cross-Correlation Method

In order to monitor optical power, a silicon waveguide admittance detecting circuit utilizing quadratic cross-correlation method was designed with the 0.18μm TSMC CMOS technology. By adopting quadratic cross-correlation operation between the target signal and the reference signal, the resolution of the waveguide admittance can be improved. The variation of the output voltage of detecting circuit is used to indicate the variation of the silicon waveguide admittance. The results of our calculations show that the resolution of waveguide admittance is 0.1pS within the operating bandwidth of 100MHz.