28 GHz 1.8 dB Insertion Loss SPDT Switch with 24 dB Isolation in 65 nm CMOS

28 GHz SPDT switch has been designed and fabricated in 65 nm CMOS with deep N-well as a building block for beamforming-based 5
^th
generation mobile communication systems. The measured insertion loss is 1.8 dB at 28 GHz, and IIP3 is measured as 11.75 dBm. The input and output return losses are and , respectively.