Scanning THz Noise Microscopy of Operating Nano-devices

Electrical currents in operating nano-devices generate terahertz noise emission due to the rich ultrafast interactions of flowing charges with hosting lattices. With a newly developed scanning noise microscope (SNoiM) in terahertz range, we present here real-space imaging of hot carrier dissipation dynamics in long-channel GaAs operating nano-devices and discuss the associated nonequilibrium relaxation mechanisms.