Improved S-Parameter Measurements of Embedded Planar Transmission-Line on Multi-Layer PCB

This paper describes improved calibration method for measuring the scattering parameters of an embedded planar transmission line on multi-layer printed circuit board (PCB) substrate from 100 MHz to 40 GHz. When using a Vector Network Analyzer (VNA) to measure the scattering parameters (S-parameters) of printed circuit board (PCB) interconnects, it can be advantageous to include the calibration and verification standards on the same PCB as the interconnects under test. Both designs of on-PCB standards and calibrated results of verification standards are presented.