Relating the Commonalities and Robustness Characteristics of EMC and ESD Tests

Components and systems must be qualified in terms of a set of electrical robustness characteristics. In this high-level presentation the various test methods of ESD and EMC will be related in terms of their application to various electronic entities, certain robustness environments and energy profiles, and transport / interaction with electronics. This will include component and system level ESD as well as EMC tests, in terms of EOS/ESD Association, IEC and ISO standards. These will include but not necessarily be limited to JS-001 and JS-002 (HBM and CDM component level), IEC 61000-4-2, -4-4, -4-5; ISO 10605, and ISO 7637-2 and -3.