Optimization for Cell Arrangement Design of Gate-Commutated Thyristors Based on Whole Wafer Model and Tabu Search

Gate-commutated thyristors (GCTs) are subject to uneven impedances along the current path from GCT circles to the gate contact, which leads to current redistribution between the GCT circles during turn-off. The current redistribution inequality significantly limits the maximum controllable current of GCTs. This paper presents an optimization method for GCT cell arrangement design to minimize the current redistribution inequality. First, the whole GCT wafer model is applied to calculate the inequality of the current redistribution. The whole GCT wafer model is a hybrid model built by physics-based GCT cell models connected with lumped parameter models. The GCT cell models applied here are improved compact models with multiple physical mechanisms, while the lumped parameter models represent the uneven impedances of the GCT circles along the GCT wafer. In order to measure those impedances, a set of physical concentric contact rings are developed. Finally, the Tabu search (TS), a heuristic algorithm, is applied to optimize the GCT cell arrangement. Using the optimization method based on TS, an optimized set of GCT cell numbers for a 4-in GCT wafer is obtained, reducing the inequality of the current redistribution by 20%.