Applying the V-I Matrix Method in the Analysis of Silicon Integrated Bragg Gratings

Optical devices are commonly simulated using transfer matrix techniques for spectrum analysis. Here, the V-I (ABCD) matrix method is reported for integrated Bragg grating (IBG) analysis. This technique was implemented in a numerical simulation and compared with a Silicon-on-Insulator fabricated IBG device with a sidelobe suppression of 4 dB and FWHM of 4.5 nm giving insights on design-fabrication issues.