The Relationship Between Switch-Term-Corrected Scattering-Parameters and Wave-Parameters Measured With a Two-Port Vector Network Analyzer

We explore the relationship between scattering-parameters (S-parameters), corrected for switch terms, and S-parameters calculated from wave-parameters measured with a two-port vector network analyzer. By deriving the equations for both representations using consistent notation, we clearly demonstrate their equivalence. This result proves that measuring wave-parameters enables us to obtain uniquely defined S-parameters for any changes of impedance behind the signal-separation hardware.