Novel Method for Multi-scale Hardware-in-the-Loop Simulation of Automotive Mechatronic Components

With more and more complex electronic control units (ECU) in modern automotive applications the need for adequate testing possibilities rises. This paper presents a hardware-in-the-Ioop (HIL) test implementation for ECUs with very high dynamic capabilities. Based on real time parallel analog and digital simulation it is able to process pulse width modulated (PWM) signals with up to 25 kilohertz with step sizes of 385 nanoseconds. The simulation's digital output signal drives newly developed power electronics, processing the high dynamic simulation results with a resolution of 1 milliampere and a current change rate of 6.4 ampere per microsecond. In addition generic simulation models of different loads are developed.