Charge based testing (CBT) of submicron CMOS SRAMs

A transient current testing technique that computes the charge delivered to the circuit during the transient circuit operation is analyzed. The method is applied to 0.5 /spl mu/m CMOS SRAMs with 1.5 million transistors that passed various logic tests. Results show that Charge Based Testing (CBT) can be used to test submicron ICs and can be applied to non fully static parts.