Analysis of microstrip lines in multilayer structures of arbitrarily varying thickness

A general approach to the full-wave analysis of microstrip lines in multilayer dielectrics of arbitrarily varying thickness is developed. It is based on the discrete mode matching technique (DMM) and uses a full-wave equivalent circuit for the stratified structure, which is simple to apply in a numerical procedure, As an example, the propagation constant of a microstrip line in the interface of two dielectrics as a function of different shape characteristics is computed.