An adaptive multi-factor fault-tolerance selection scheme for FPGAs in space applications

Fault-Tolerant is currently an essential feature in critical systems. In space applications, many of these systems utilize SRAM-based FPGAs. Due to the small device dimensions in today's FPGAs and the harsh environment in outer space, Multiple Event Upsets (MEUs) can no longer be neglected. This paper presents a technique able to tolerate both MEUs and Single Event Upsets (SEUs); it also dynamically determines the appropriate Fault-Tolerant architecture to be applied to each module in the system. This technique aims at maximizing system reliability while consuming as little battery power as possible. Another important contribution of this technique is that it does not only depend on the failure rate but relies on several other factors that keep changing during the mission such as the battery level, module criticality, type of failures, etc. A case study is presented to illustrate the use of the technique.