Deconvolution-based spatial resolution improvement technique for resistivity scans acquired with split-post dielectric resonator

Resistivity scans of inhomogeneous samples obtained with the technique based on Split-Post Dielectric Resonator suffer from limited spatial resolution due to weighted averaging of the complex permittivity distribution over the sample's volume. A deconvolution-based technique is proposed to increase the resolution of scans as well as to enable measurement of homogeneous samples which do not meet the minimal dimensions criterion for the given resonator.