Comparison of Two Model based Temperature Control Systems Implemented on a Three Level T-Type Inverter

This paper presents two model based temperature control systems to increase the expected lifetime of IGBT-power-modules. The increase of the expected lifetime is achieved by increasing the power losses du ring low load conditions in order to decrease the junction temperature swings of the semiconductor devices in IGBT-power-modules. Each temperature control system uses a different correcting variable. As correcting variables the current amplitude and the switching frequency are used. The temperature control systems are implemented on a three level T-type inverter and the functionality of the temperature control systems is verified by measurements on a machine test bench.