Detection of hard-to-detect stuck-at faults and generation of their tests based on testability functions

An efficient method is proposed for detecting hard-to-detect stuck-at faults of combinational circuits and generating all tests or one test vector for them. The method is based on the previously proposed efficient methods of constructing the ODNF and ROBDD representations of the observability and stuck-at fault detection Boolean functions, corresponding to a line of the combinational circuit.