An active register control strategy for multilayer R2R printed electronics based on microscope vision

Multilayer alignment is the decisive factor that influences performance of printed electronics in R2R process. This paper presents an active register control strategy to achieve high-precision registration between layers. A high resolution microscope camera is used to measure registration error in proposed strategy. Due to the small view field of the microscope camera, it's difficult to calibrate this camera by conventional methods. Therefore, a motion-based calibration method which utilizes relative micromovement of print header is proposed firstly. This register control strategy fine-tunes the trajectory of nozzle in XOY plane by five degree of freedom compliant alignment stage. The calibration method and designed control strategy are verified in experiment and results indicate that the microscope camera is calibrated accurately and high resolution registration is ultimately realized.