Prediction of radiated emission pattern for the device under test

Procedure to predict the radiated emission pattern in a complex test setup is illustrated in this paper. Device under test (DUT) is divided into three domains to facilitate the electromagnetic simulations. Huygens surface is used to capture the near fields for each domain and then formed single Huygens surface for the given DUT. Near field to far field transformation is applied on this surface to obtain the radiated emission pattern. Radiation from DUT is also captured in terms of total radiated power (TRP) using the radiated emission patterns.